The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Jun. 25, 2020
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An abnormality detection device that detects an abnormality of a target device includes a processor that executes a process of acquiring a plurality of types of measured values of the target device, a process of calculating Mahalanobis distances of the acquired plurality of types of measured values, a process of extracting the plurality of Mahalanobis distances calculated in a past predetermined period from a point in time of evaluation of the target device and calculating a moving average value of a square value of each of the extracted Mahalanobis distances, and a process of determining whether or not an abnormality has occurred in the target device on the basis of the moving average value.