The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

May. 19, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kedar Kulkarni, Bangalore, IN;

Padmanabha Venkatagiri Seshadri, Mysore, IN;

Satyam Dwivedi, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01); G06F 16/28 (2019.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01); G06F 16/285 (2019.01); G06K 9/6215 (2013.01); G06K 9/6224 (2013.01);
Abstract

One embodiment provides a method, including: receiving a multi-variate time-series dataset comprising a plurality of time-dependent datasets; for each of the plurality of time-dependent datasets, segmenting each of the plurality of time-dependent datasets at a transition point; clustering segments of the plurality of time-dependent datasets into clusters having similar lengths of segments; for each cluster (i) selecting a representative segment length and (ii) identifying a feature subset in that cluster; identifying, across the feature subsets, subset transition points, wherein each of the subset transition points corresponds to a change in value that meets a predetermined threshold within its corresponding feature subset; and determining, by applying a threshold test to the subset transition points, a segment length to be used in segmenting the entire multi-variate time-series dataset.


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