The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Dec. 04, 2020
International Business Machines Corporation, Armonk, NY (US);
John Jesse Wood, St Albans, GB;
Michael Kirwan, Cambridge, GB;
Gareth James Hugh Morgan, Loughton, GB;
Pierre Pook, Cambridge, GB;
Kristian Memarzia, Leeds, GB;
Zachary Charles Beckett Pywell, Stamford, GB;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Provided are techniques for generating highlight queries. Data is analyzed using one or more schemas to identify patterns and frequencies of the patterns in the data. The patterns and the frequencies of the patterns are stored in a global patterns structure. A graph is analyzed to identify one or more of the patterns in the global patterns structure that are present in the graph and in which frequencies. The identified one or more of the patterns in the global patterns structure that are present in the graph are added to a per-user patterns structure with the frequencies of those patterns. The patterns in the per-user patterns structure are scored. A subset of the patterns in the per-user patterns structure that have scores above a threshold are selected as highlight queries. The selected subset of the patterns are executed as highlight queries to generate results, and the results are returned.