The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Oct. 30, 2020
Micro Focus Llc, Santa Clara, CA (US);
Tsachi Ben Zur, Yehud, IL;
Dror Saaroni, Yehud, IL;
Eyal Luzon, Yehud, IL;
Gil Nakache, Yehud, IL;
Motti Lanzkron, Yehud, IL;
Micro Focus LLC, Santa Clara, CA (US);
Abstract
Embodiments of the disclosure provide systems and methods for performing functional testing on an application using artificial intelligence. According to one embodiment, a method for performing functional testing on an Application Under Test (AUT) can comprise maintaining, by a processor of an edge computing device, a model comprising a script defining one or more automatic tests for the AUT and trained data identifying objects of a user interface of the AUT. One or more tests can be executed on the AUT by the processor of the edge computing device based on the script and the trained data identifying the objects of the user interface of the AUT. Results of executing the one or more tests on the AUT can be provided by the processor of the edge computing device.