The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Dec. 19, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hodong Lee, Suwon-si, KR;

Kwanghyun Koh, Suwon-si, KR;

Kiyoung Yang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/16 (2006.01); G06F 11/34 (2006.01); G06F 17/18 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G06F 11/1629 (2013.01); G06F 11/34 (2013.01); G06F 11/3452 (2013.01); G06F 17/18 (2013.01); G01M 99/005 (2013.01);
Abstract

An electronic apparatus is provided. The electronic apparatus includes a storage storing error-related information of an external electronic apparatus, and a processor configured to obtain first error-related information with respect to a target time interval and second error-related information with respect to a standard time interval including the target time interval and time intervals other than the target time interval, from the storage, obtain frequency information for each number of error occurrences with respect to the target time interval based on the first error-related information and frequency information for each number of error occurrences with respect to the standard time interval based on the second error-related information, and compare the frequency information for each number of error occurrences with respect to the target time interval with the frequency information for each number of error occurrences with respect to the standard time interval to identify an error occurrence level with respect to the target time interval.


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