The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Apr. 24, 2020
Andor Technology Limited, Belfast, GB;
Allister Pattison, Ballynure, GB;
Andor Technology Limited, Belfast, GB;
Abstract
A microscope comprises a microscope objective, a camera and an imaging optical system for imaging an object through the objective to the camera along a first optical path. A projection optical system is provided for projecting a test image onto the object through the objective, and the imaging optical system is configured to image the projected test image from the object to the camera through the objective and along at least part of the first optical path. A focus adjustment system is provided for focusing the test image at the camera. Using the same objective and the same camera for both imaging and focusing allows reduction of the cost of the microscope in comparison with known microscopes that provide separate focusing systems.