The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Sep. 28, 2020
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Shuchin Aeron, Newton, MA (US);
Yanting Ma, Allston, MA (US);
Petros Boufounos, Winchester, MA (US);
Hassan Mansour, Boston, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
An imaging system to reconstruct a reflectivity image of a scene including an object moving with the scene. A tracking system to track a deforming object to estimate an object deformation for each time step. Sensors acquire snapshots of the scene, each acquired snapshot of the object includes measurements in the object deformation for that time step, to produce a set of object measurements with deformed shapes over the time steps. Compute a correction to estimates of object deformation for each time step, with matching measurements of the corrected object deformation for each time step to measurements in the acquired snapshot of object for that time step. Select a corrected deformation over other corrected deformations for each time step, according to a distance between the corrected deformation and the estimate of the deformation, to obtain a final estimate of the deformation of the deformable object moving in the scene.