The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Aug. 18, 2020
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Lifeng Guan, Singapore, SG;

Wai Keung Frankie Chan, Singapore, SG;

Adrian Gan, Singapore, SG;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01); G01R 31/317 (2006.01); G01R 31/327 (2006.01); G01R 31/14 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3004 (2013.01); G01R 1/067 (2013.01); G01R 31/14 (2013.01); G01R 31/31702 (2013.01); G01R 31/3274 (2013.01);
Abstract

Examples relate to a current sensor and to a method for sensing a strength of an electric current using two groups of magnetic sensing probes. The current sensor includes a first group and a second group of magnetic sensing probes. The current sensor comprises sensor circuitry coupled to the first and the second group of magnetic sensing probes. The sensor circuitry is configured to determine a first differential magnetic field measurement of a magnetic field using probes of the first group of magnetic sensing probes. The sensor circuitry is configured to determine a second differential magnetic field measurement of the magnetic field using probes of the second group of magnetic sensing probes. The sensor circuitry is configured to determine a strength of the electric current based on a difference between the first differential magnetic field measurement and the second differential magnetic field measurement.


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