The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Nov. 30, 2019
Applicant:
Nanosurf Ag, Liestal, CH;
Inventor:
Dominik Ziegler, Berkeley, CA (US);
Assignee:
Nanosurf AG, Liestal, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/14 (2010.01); G01Q 30/14 (2010.01); G01Q 70/02 (2010.01); G01Q 70/10 (2010.01); G01Q 60/24 (2010.01);
U.S. Cl.
CPC ...
G01Q 70/14 (2013.01); G01Q 30/14 (2013.01); G01Q 70/02 (2013.01); G01Q 70/10 (2013.01); G01Q 60/24 (2013.01);
Abstract
Articles and methods related to scanning probe microscopy probes are generally provided. A scanning probe microscopy probe may comprise a chip, a mechanical resonator attached to the chip, a tip attached to the mechanical resonator, and a handle attached to the chip. The handle may have a length of at least 5 mm and an average thickness of less than or equal to 500 microns. The probe may further comprise an insulating coating covering both the chip and the handle.