The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Feb. 25, 2019
Applicant:

Jvc Kenwood Corporation, Yokohama, JP;

Inventors:

Shigehiko Iwama, Yokohama, JP;

Masahiro Yamamoto, Yokohama, JP;

Atsushi Saito, Yokohama, JP;

Assignee:

JVC KENWOOD CORPORATION, Yokohama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); G01N 33/54353 (2013.01); G01N 33/54366 (2013.01); G01N 33/54386 (2013.01); G01N 35/00069 (2013.01);
Abstract

A nanoparticle measurement device includes a timing signal generation unit, a low-frequency component extraction unit, a low-frequency component calculation unit, a threshold correction unit, and a measurement unit. The timing signal generation unit generates timing signals. The low-frequency component extraction unit extracts low-frequency components according to the timing signals. The low-frequency component calculation unit calculates an interpolated low-frequency component in accordance with the low-frequency components. The threshold correction unit sets a corrected threshold in accordance with the interpolated low-frequency component. The measurement unit extracts and counts nanoparticle pulse signals from a light reception signal according to the timing signals and the corrected threshold.


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