The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Dec. 09, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aminat Adebiyi, San Jose, CA (US);

Mohammed Abdi, San Jose, CA (US);

Andrea Fasoli, San Jose, CA (US);

Alberto Mannari, San Jose, CA (US);

Luisa Bozano, Los Gatos, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0034 (2013.01); G01N 33/0047 (2013.01); G06N 20/00 (2019.01);
Abstract

Provided is a method and system for extracting features from raw data for machine learning processing. Using an array of gas sensors, raw data for at least one compound of interest are extracted based upon the type of output signals. Where the output signals are amplitude-variant, mean features are extracted by chunking the raw data into slices and calculating the mean area under the curve. Where the output signals are amplitude-and-time-variant, mean-plus-slope features are extracted by taking logarithmic values of the raw data and calculating the mean area under the curve.


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