The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Dec. 11, 2019
Zetec, Inc., Snoqualmie, WA (US);
Steve Timm, Bellevue, WA (US);
Evan Lloyd, Fall City, WA (US);
Tom O'Dell, Maple Valley, WA (US);
Bill Ziegenhagen, Black Diamond, WA (US);
Evans Nguyen, Issaquah, WA (US);
Zetec, Inc., Snoqualmie, WA (US);
Abstract
A flexible eddy current probe for non-destructive testing of a metallic object may include one or more plus-point coils and a flexible printed circuit having first and second parallel sides, third and fourth parallel sides, and a number of adjacent strips. The strips have first and second ends that are contiguous with the first and second parallel sides, respectively. Each of the strips may contain a pair of coils oriented along the length of the strip, a first coil being proximate to the first end and a second coil being proximate to the second end, and each of the coils is configured to excite an eddy current in the metal object or to sense an eddy current. Each of the strips may also be independently flexible from one another. The eddy current sensor array is configured to be scanned over the metal object.