The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Dec. 08, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventor:
Eric V. Kline, Pine Island, MN (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01); G03H 1/22 (2006.01); G03H 1/00 (2006.01); G01B 9/02 (2022.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G01B 9/021 (2013.01); G01B 9/02085 (2013.01); G03H 1/0005 (2013.01); G03H 1/0443 (2013.01); G03H 1/2294 (2013.01); G03H 2001/0033 (2013.01);
Abstract
Methods, systems and computer program products for performing visual quality assessment using holographic interferometry are provided. Aspects include obtaining a reference holographic pattern based on a reference object and obtaining a test holographic pattern based on a test object. Aspects also include creating an interference pattern by superimposing the test holographic pattern onto the reference holographic pattern. Aspects further include determining a difference between the reference object and the test object based upon the interference pattern.