The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Apr. 09, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Shuran Sheng, Saratoga, CA (US);

Lin Zhang, San Jose, CA (US);

Joseph C. Werner, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/50 (2006.01); H01J 37/32 (2006.01); H01L 21/67 (2006.01); C23C 16/458 (2006.01); H01L 21/02 (2006.01); H01L 27/11551 (2017.01); H01L 27/11578 (2017.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
C23C 16/50 (2013.01); C23C 16/4583 (2013.01); H01J 37/3244 (2013.01); H01J 37/32724 (2013.01); H01J 37/32899 (2013.01); H01L 21/67017 (2013.01); H01L 21/67167 (2013.01); H01J 2237/002 (2013.01); H01J 2237/3321 (2013.01); H01L 21/022 (2013.01); H01L 21/0217 (2013.01); H01L 21/02164 (2013.01); H01L 21/02274 (2013.01); H01L 21/68742 (2013.01); H01L 27/11551 (2013.01); H01L 27/11578 (2013.01);
Abstract

Exemplary semiconductor processing chambers may include a substrate support positioned within a processing region of the semiconductor processing chamber. The chamber may include a lid plate. The chamber may include a gasbox positioned between the lid plate and the substrate support. The gasbox may be characterized by a first surface and a second surface opposite the first surface. The gasbox may define a central aperture. The gasbox may define an annular channel in the first surface of the gasbox extending about the central aperture through the gasbox. The gasbox may include an annular cover extending across the annular channel defined in the first surface of the gasbox. The chamber may include a blocker plate positioned between the gasbox and the substrate support. The chamber may include a ferrite block positioned between the lid plate and the blocker plate.


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