The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Mar. 04, 2020
Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventors:

Makoto Kataoka, Tokyo, JP;

Takenobu Nakamura, Tokyo, JP;

Shigeki Okatake, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/09 (2006.01); G01R 33/00 (2006.01); A61B 5/242 (2021.01); A61B 5/243 (2021.01); A61B 5/245 (2021.01);
U.S. Cl.
CPC ...
A61B 5/242 (2021.01); G01R 33/0011 (2013.01); G01R 33/0023 (2013.01); G01R 33/0094 (2013.01); G01R 33/0206 (2013.01); G01R 33/091 (2013.01); A61B 5/243 (2021.01); A61B 5/245 (2021.01); A61B 2562/0223 (2013.01); A61B 2562/046 (2013.01);
Abstract

A measurement apparatus is provided, which includes a magnetic sensor array formed by three-dimensionally arranging a plurality of magnetic sensor cells each including a magnetic sensor, and capable of detecting an input magnetic field in three axial directions; a measurement data acquiring section that acquires a plurality of measurement values based on the input magnetic field detected by the magnetic sensor array; a magnetic field calculating section that calculates the input magnetic field based on the measurement values; an error calculating section that calculates a detection error of the input magnetic field, based on the plurality of measurement values and a calculation result obtained by calculating the input magnetic field; and a measurement data selecting section that selects a plurality of measurement values to be used for calculating the input magnetic field by the magnetic field calculating section, from among the plurality of measurement values, based on the detection error.


Find Patent Forward Citations

Loading…