The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
May. 18, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventors:
Takashi Hiramatsu, Kanagawa, JP;
Jungo Harigai, Kanagawa, JP;
Hirokazu Ichikawa, Kanagawa, JP;
Yoshitaka Kuwada, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/028 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00034 (2013.01); H04N 1/00018 (2013.01); H04N 1/00087 (2013.01); H04N 1/00819 (2013.01); H04N 1/02815 (2013.01); H04N 1/02885 (2013.01);
Abstract
A measurement apparatus includes a light irradiator that irradiates a measurement target with light and a processor that controls the light irradiator, in which the processor is configured to irradiate a specific place of the measurement target with the light from plural places having different positions in one direction, and irradiate the specific place of the measurement target with the light from the plural places having different positions in a direction intersecting the one direction.