The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Nov. 29, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Baekmin Lim, Daejeon, KR;

Seungjin Kim, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/095 (2006.01); H03L 7/099 (2006.01); H03L 7/089 (2006.01); H03M 7/16 (2006.01);
U.S. Cl.
CPC ...
H03L 7/095 (2013.01); H03L 7/0891 (2013.01); H03L 7/099 (2013.01); H03M 7/16 (2013.01);
Abstract

An automatic frequency calibration and lock detection circuit includes a frequency error generator circuit, an automatic frequency calibration signal generator circuit, and a lock flag generator circuit. The frequency error generator circuit generates a frequency error signal based on a reference frequency signal and an output frequency signal. The frequency error signal represents a difference between a frequency of the output frequency signal and a target frequency. The automatic frequency calibration signal generator circuit generates an automatic frequency calibration output signal and an automatic frequency calibration done signal based on the frequency error signal and a first clock signal. The lock flag generator circuit generates a lock done signal based on the frequency error signal, the automatic frequency calibration done signal and a second clock signal. The frequency error generator circuit is shared by the automatic frequency calibration signal generator circuit and the lock flag generator circuit.


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