The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Jan. 28, 2021
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventor:

Yoo Hyun Noh, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/48 (2006.01); H01L 27/06 (2006.01); H01L 23/538 (2006.01); H01L 21/768 (2006.01); H01L 27/11582 (2017.01); H01L 27/11556 (2017.01);
U.S. Cl.
CPC ...
H01L 21/486 (2013.01); H01L 21/76802 (2013.01); H01L 21/76877 (2013.01); H01L 23/5384 (2013.01); H01L 23/5386 (2013.01); H01L 27/0688 (2013.01); H01L 27/11556 (2013.01); H01L 27/11582 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes forming a stacked structure with first material layers and second material layers that are stacked alternately with each other, forming a first slit that passes through the stacked structure, forming a second slit that passes through the stacked structure, forming a contact hole between the first slit and the second slit that passes through the stacked structure, forming a sealing layer that seals the first slit, the second slit and the contact hole, forming first openings that pass through the sealing layer to form first sealing regions and partially expose the first slit to form first exposed regions, forming a first slit insulating layer by filling the first exposed regions and first sealing regions, etching the sealing layer to open the contact hole, and forming a first contact plug in the contact hole.


Find Patent Forward Citations

Noh, Yoo. (2022). Semiconductor device and manufacturing method of semiconductor device (U.S. Patent No. 11495473). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11495473

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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