The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Apr. 12, 2021
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Won Jae Choi, Icheon-si, KR;

Da Woon Han, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 16/26 (2006.01); G11C 16/10 (2006.01); G11C 16/04 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 16/0483 (2013.01); G11C 16/10 (2013.01); G11C 11/5671 (2013.01);
Abstract

According to the present technology, a memory device may include memory cells configured to be programmed so that each of the memory cells has a threshold voltage corresponding to any one of a plurality of program states, a peripheral circuit configured to perform a read operation or a program operation on the memory cells, and control logic configured to control the peripheral circuit to perform a test read operation of reading the memory cells using a test read voltage that is any one read voltage among preset default read voltages, and perform a refresh program operation of applying a refresh program voltage to some memory cells among the memory cells according to the number of memory cells having a threshold voltage greater than the test read voltage.


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