The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Oct. 16, 2020
Panasonic Intellectual Property Corporation of America, Torrance, CA (US);
Satoshi Yoshikawa, Hyogo, JP;
Toshiyasu Sugio, Osaka, JP;
Toru Matsunobu, Osaka, JP;
Tatsuya Koyama, Kyoto, JP;
Masaki Fukuda, Osaka, JP;
Shunsuke Yasugi, Singapore, SG;
PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA, Torrance, CA (US);
Abstract
A method for analyzing a three-dimensional model of an object which includes: obtaining the three-dimensional model generated based on images of the object, the images being imaged by respective cameras from respective viewpoints, the three-dimensional model including three-dimensional points each of which indicating a position of the object; obtaining a camera parameter of one camera among the respective cameras; generating, based on the camera parameter and the three-dimensional model, a depth image indicating a distance between the one camera and the object; generating a foreground image indicating an area in which the object is present in the one image imaged by the one camera; comparing the depth image and the foreground image to determine whether there is a deficiency of a three-dimensional point in the three-dimensional model; and outputting deficiency information if it is determined that there is the deficiency of the three-dimensional point in the three-dimensional model.