The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

May. 05, 2021
Applicant:

Imagination Technologies Limited, Kings Langley, GB;

Inventors:

Luke T. Peterson, San Francisco, CA (US);

Justin P. DeCell, San Francisco, CA (US);

Jens Fursund, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 15/00 (2011.01); G06T 15/04 (2011.01); G06T 15/50 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 15/00 (2013.01); G06T 15/005 (2013.01); G06T 15/04 (2013.01); G06T 15/506 (2013.01); G06T 2215/12 (2013.01); G06T 2215/16 (2013.01);
Abstract

A bounce light map for a scene is determined for use in rendering the scene in a graphics processing system. Initial lighting indications representing lighting within the scene are determined. For a texel position of the bounce light map, the initial lighting indications are sampled using an importance sampling technique to identify positions within the scene. Sampling rays are traced between a position in the scene corresponding to the texel position of the bounce light map and the respective identified positions with the scene. A lighting value is determined for the texel position of the bounce light map using results of the tracing of the sampling rays. By using the importance sampling method described herein, the rays which are traced are more likely to be directed towards more important regions of the scene which contribute more to the lighting of a texel.


Find Patent Forward Citations

Loading…