The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Nov. 18, 2020
Applicant:

Disney Enterprises, Inc., Burbank, CA (US);

Inventors:

Miquel Angel Farré Guiu, Bern, CH;

Marc Junyent Martin, Barcelona, ES;

Pablo Pernias, Alicante, ES;

Assignee:

Disney Enterprises, Inc., Burbank, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/90 (2017.01); G06V 10/44 (2022.01); G06V 10/56 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 7/90 (2017.01); G06V 10/44 (2022.01); G06V 10/56 (2022.01); G06V 10/751 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/20036 (2013.01);
Abstract

A method includes generating a delicate area map by performing a morphological function on a portion of a received first image and identifying a plurality of edges in the first image, the plurality of edges comprising a plurality of pixels. The method also includes verifying a first contrast metric for a first subset of pixels that are in the plurality of pixels but not in the delicate area map, verifying a second contrast metric for a second subset of pixels that are in the plurality of pixels and in the delicate area map, and generating a validation result based on the verifying of the first contrast metric and the verifying of the second contrast metric.


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