The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Apr. 29, 2021
Jumio Corporation, Palo Alto, CA (US);
Reza R. Derakhshani, Shawnee, KS (US);
Vikas Gottemukkula, Kansas City, KS (US);
Yash Joshi, Kansas City, MO (US);
Sashi Kanth Saripalle, Overland Park, KS (US);
Tetyana Anisimova, Shawnee, KS (US);
Jumio Corporation, Palo Alto, CA (US);
Abstract
A method for detecting adverse conditions associated with a device includes receiving, at one or more processing devices at one or more locations, one or more image frames; receiving a set of signals representing outputs of one or more sensors of a device; estimating, based on the one or more image frames, a first set of one or more motion values; estimating, based on the set of signals, a second set of one or more motion values; determining that a degree of correlation between (i) a first motion represented by the first set of one or more motion values and (ii) a second motion represented by the second set of one or more motion values fails to satisfy a threshold condition; and in response to determining that the degree of correlation fails to satisfy the threshold condition, determining presence of an adverse condition associated with the device.