The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Aug. 21, 2020
Applicant:
Abb Schweiz Ag, Baden, CH;
Inventor:
Nevroz Sen, San Jose, CA (US);
Assignee:
ABB Schweiz AG, Baden, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/90 (2017.01); G06V 10/25 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06T 7/001 (2013.01); G06T 7/90 (2017.01); G06V 10/25 (2022.01); G06V 10/751 (2022.01);
Abstract
An inspection system is provided for detecting defects on surfaces. The system uses a pattern with varying color or darkness which faces the surface. A light illuminates the pattern on the surface so that the pattern and any defects on the surface are reflected and captured for image analysis. The processor then separates the pattern from the image in order to identify the locations of any defects on the surface.
Sen, Nevroz. (2022). Surface defect detection system (U.S. Patent No. 11494892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11494892
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile