The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Mar. 15, 2019
Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong, HK;
Yang Liu, Hong Kong, HK;
Kangheng Wu, Hong Kong, HK;
Zhi Bin Lei, Hong Kong, HK;
Vincent Wai-Leuk Tam, Hong Kong, HK;
Wei Chen Huang, Hong Kong, HK;
Lawrence Kwan Yeung, Hong Kong, HK;
Abstract
A method of high dimensional data analysis in real-time comprising executing dimension-reducing an input historical data set under a t-SNE model and determining from the resulting dimension-reduced data set a recent; further dimension-reducing the recent group data set under a PCA model; statistical analyzing the further dimension-reduced data set to determine a threshold group for distinguishing abnormal data from normal ones in a real-time data stream. The method may further include training a classifier using the abnormal or normal data set for predicting anomaly in the real-time data source system. Alternatively, a discrepancy training data set is computed from one of the normal and abnormal data sets and be used to train one of independent normal and abnormal data regression models; with the other one trained by transfer learning based on the trained one. The trained regression models are then used to predict discrepancy values.