The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Mar. 20, 2020
Nvidia Corporation, Santa Clara, CA (US);
Sreedhar Narayanaswamy, Sunnyvale, CA (US);
Shantanu K. Sarangi, Saratoga, CA (US);
Hemalkumar Chandrakant Doshi, San Jose, CA (US);
Hari Unni Krishnan, San Carlos, CA (US);
Gunaseelan Ponnuvel, San Jose, CA (US);
Brian Lawrence Smith, Mountain View, CA (US);
NVIDIA Corporation, Santa Clara, CA (US);
Abstract
Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.