The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Oct. 28, 2020
Applicant:

Uipath, Inc., New York, NY (US);

Inventors:

Thomas Stocker, Gaishorn, AT;

Kartik Iyer, Karnataka, IN;

Radhakrishnan Iyer, Karnataka, IN;

Naveen Kumar M, Karnataka, IN;

Gerd Weishaar, Vienna, AT;

Christian Mayer, Vienna, AT;

Assignee:

UiPath, Inc., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01);
Abstract

A system and a computer-implemented method for analyzing workflow of test automation associated with a robotic process automation (RPA) application are disclosed herein. The computer-implemented method includes receiving the workflow of the test automation associated with the RPA application and analyzing, via an Artificial Intelligence (AI) model associated with a workflow analyzer module, the workflow of the test automation based on a set of pre-defined test automation rules. The computer-implemented method further includes determining one or more metrics associated with the analyzed workflow of the test automation and generating, via the AI model, corrective activity data based on the determined one or more metrics.


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