The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Jan. 28, 2019
Applicant:

American Megatrends International, Llc, Duluth, GA (US);

Inventors:

Anurag Bhatia, Lilburn, GA (US);

Samvinesh Christopher, Suwanee, GA (US);

Winston Thangapandian, Suwanee, GA (US);

Utpal Patel, Suwanee, GA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/22 (2006.01); G06F 11/263 (2006.01); G06F 8/61 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 8/61 (2013.01); G06F 11/2284 (2013.01); G06F 11/263 (2013.01); G06F 11/3664 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

In an aspect of the disclosure, a method, a computer-readable medium, and a device are provided. The device determines one or more feature components of firmware of a BMC to be tested. The device also determines a respective QA category from a plurality of QA categories for each of the one or more feature components. Each of the plurality of QA categories is associated with a set of feature components and a set of the test cases. The device further determines respective at least one test case for each of the one or more feature components based on the respective QA category of the each feature component. The test case specifies hardware and a procedure to be used to test the each feature component.


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