The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Sep. 06, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Ryota Higa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06Q 10/08 (2012.01); G06Q 30/06 (2012.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G06Q 10/087 (2013.01); G06Q 30/0631 (2013.01);
Abstract

A model generation apparatus () acquires component failure data in which a usage status is associated with a failure record of a component. The model generation apparatus () generates, for each of a plurality of component groups, a prediction model for predicting the number of failures of each component included in the component group by using the component failure data relating to the component belonging to the component group. The prediction model computes a prediction value of the total number of failures of the components belonging to a corresponding component group from the usage status, and computes a prediction value of the number of failures of each component belonging to the component group from the computed prediction value of the total number of failures.


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