The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Jan. 20, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Konstantin Ivanchenko, Munich, DE;

Cristian Garbossa, Bressanone, IT;

Bejoy Mathews, Oberhaching, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/3234 (2019.01); G06F 1/3206 (2019.01);
U.S. Cl.
CPC ...
G06F 1/3243 (2013.01); G06F 1/3206 (2013.01);
Abstract

Systems, methods, and circuitries are provided for controlling a microcontroller (MCU) on a per-application basis. A control system includes a microcontroller unit (MCU) including a first application group and a second application group. The first application group includes at least one hardware component not associated with the second application group. The control system includes a power management integrated circuit (PMIC). The PMIC includes monitoring circuitry configured to monitor the first application group to detect a first application group fault condition and monitor the second application group to detect a second application group fault condition. Based on the monitoring, the PMIC provides a first reset signal to the first application group that does not reset the second application group or provides a second reset signal to the second application group that does not reset the first application group.


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