The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Sep. 24, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Qiqing Christine Ouyang, Yorktown Heights, NY (US);

Igor Khapov, Moscow, RU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01); G05B 19/4063 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/4063 (2013.01); G06N 20/00 (2019.01); G05B 2219/31439 (2013.01); G05B 2219/32222 (2013.01);
Abstract

An approach alerting users based on a detected defect during manufacturing quality inspection based on graphical images is disclosed. The approach initiates a device inspection, wherein a model controller collects metadata about a product to be inspected and select a first model with a highest score to identify defects in the device. The approach utilizes an API to obtain results from the inspection and after determining that another model is available, initiating the second model run via an edge device performing the inspection of the device. And the algorithm awaits a response in detecting a defect during either the first model run or the second model run, providing an alert detailing the defect detected in the device.


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