The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Sep. 04, 2018
Applicants:
Sameh Sarhan, Santa Clara, CA (US);
Lawrence Herbert Zuckerman, Sacramento, CA (US);
Inventors:
Sameh Sarhan, Santa Clara, CA (US);
Lawrence Herbert Zuckerman, Sacramento, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/558 (2006.01); G01D 5/14 (2006.01); G01R 29/14 (2006.01); G01R 33/09 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 33/558 (2013.01); G01D 5/145 (2013.01); G01R 29/14 (2013.01); G01R 33/091 (2013.01); G01R 33/1269 (2013.01); G01R 33/1276 (2013.01);
Abstract
A system, apparatus, and method for registering and interpreting the results of lateral flow assay determination by using electric, magnetic, and RF sensors incorporated within the test strip, attached to the inside of the enclosure for same and/or contained in a test fixture; instead of relying on optical inspection techniques. This method features high reliability, low cost, and ability for quantitative and dynamic measurements.