The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

May. 29, 2019
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

3d Industrial Imaging Co., Ltd., Seoul, KR;

Inventors:

Jaeseon Kim, Suwon-si, KR;

Kyunyeon Kim, Seoul, KR;

Hyungbum Kim, Seoul, KR;

Jongsu Lee, Suwon-si, KR;

Youngjin Yi, Suwon-si, KR;

Donghyeon Hwang, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/57 (2006.01); G01N 21/27 (2006.01); G01N 21/25 (2006.01); G01N 21/95 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); G01J 3/50 (2013.01); G01N 21/25 (2013.01); G01N 21/274 (2013.01); G01N 21/95 (2013.01); G01N 2201/0221 (2013.01);
Abstract

Various embodiments of the present invention relate to an apparatus and method for measuring the surface of an electronic device, the apparatus comprising: a seating portion on which the electronic device is seated; a first light source for irradiating first light on the surface of the electronic device; a first camera for photographing the surface using the first light; a second light source for irradiating second light on the surface of the electronic device; a second camera for photographing the surface using the second light; and an analyzer electronically connected to the first light source, the first camera, the second light source, and the second camera, wherein the analyzer is setup to analyze the color of the surface acquired using the first light source and the first camera; and the gloss of the surface acquired using the second light source and the second camera, so as to analyze the color and gloss of the surface of the electronic device using quantified and digitized data, thereby enabling quality inspection of the surface of the electronic device without deviation. Various other embodiments are possible.


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