The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Jan. 19, 2018
National University Corporation Kumamoto University, Kumamoto, JP;
Ushio Denki Kabushiki Kaisha, Tokyo, JP;
Yuta Nakashima, Kumamoto, JP;
Kinichi Morita, Tokyo, JP;
National University Corporation Kumamoto University, Kumamoto, JP;
Ushio Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A purpose of the present invention is to provide an optical measurement system or the like suitable for optical measurement of nucleic acids, proteins, etc. In a first aspect of the present invention, an optical measurement system that provides optical sample measurement comprises: an optical cell having a sample-holding hollow portion; and a light source unit that emits broadband light containing first and second light to the optical cell. The optical cell includes: a first light guide where light passes through a first transparent portion that transmits the first light more readily than the second light and the hollow portion without passing through a second transparent portion that transmits the second light more readily than the first light; and a second light guide that differs from the first light guide, in which light passes through the second transparent portion and the hollow portion without passing through the first transparent portion.