The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Mar. 19, 2021
Applicant:

Canon Medical Systems Corporation, Otawara, JP;

Inventors:

Xiaohui Zhan, Vernon Hills, IL (US);

Ilmar Hein, Vernon Hills, IL (US);

Xiaofeng Niu, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/584 (2013.01); A61B 6/4241 (2013.01); A61B 6/585 (2013.01);
Abstract

An apparatus, system and method for calibrating an x-ray apparatus including acquiring sinogram data by scanning a symmetrical phantom using a plurality of detector channels; generating mirror-copied sinogram data by mirror-copying at least one of first sinogram data and second sinogram data of the acquired sinogram data, wherein the first sinogram data and the second sinogram data are generated by dividing the sinogram data at a center detector channel of the plurality of detector channels; outputting a first reconstructed image by reconstructing the mirror-copied sinogram data; and determining a calibration parameter based on the first reconstructed image.


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