The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Aug. 21, 2020
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

James Zhengshe Liu, Salt Lake City, UT (US);

Christopher Welsh, Lehi, UT (US);

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); H05G 1/44 (2006.01); A61B 6/00 (2006.01); H01J 35/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/582 (2013.01); A61B 6/4441 (2013.01); A61B 6/5205 (2013.01); A61B 6/542 (2013.01); H01J 35/025 (2013.01);
Abstract

A system for imaging an object includes an X-ray source operative to transmit X-rays through the object and a detector to receive the X-ray energy of the X-rays after passing through the object and to generate corresponding object X-ray intensity. The system also includes a controller to measure a detector entrance dose with no object being placed on the X-ray beam path and determine a relationship between an X-ray tube electrical parameter and the detector entrance dose. The controller further determines a relationship between the X-ray tube electrical parameter, the detector entrance dose and a detector average pixel intensity and obtains a normalized air map as a function of the X-ray tube electrical parameter based on calibration image data. The controller also generates an air map based on the normalized air map, the detector entrance dose and the detector average pixel intensity and reconstructs an image of the object based on the air map and the measured object X-ray intensity.


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