The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Sep. 10, 2018
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventor:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); G01J 1/44 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2357 (2013.01); G01J 1/44 (2013.01); G01M 11/00 (2013.01);
Abstract

A two-dimensional flicker measurement apparatus includes: a first calculation unit that calculates a flicker amount of each of a plurality of measurement regions set on a measurement target based on a photometric quantity obtained by performing photometry in the measurement target at a first sampling frequency; a second calculation unit that calculates a flicker amount of a predetermined measurement region set on the measurement target based on a photometric quantity obtained by performing photometry in the predetermined measurement region at a second sampling frequency; and a correction unit that corrects the flicker amount of each of the plurality of measurement regions calculated by the first calculation unit using a correction coefficient defined by the flicker amount calculated by the second calculation unit and a flicker amount of the predetermined measurement region calculated based on a photometric quantity obtained by performing photometry in the predetermined measurement region at the first sampling frequency.


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