The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Apr. 11, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventor:

Atsushi Hirabayashi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 15/16 (2006.01); H04M 11/00 (2006.01); H04W 4/24 (2018.01);
U.S. Cl.
CPC ...
H04M 15/16 (2013.01); H04M 11/002 (2013.01); H04W 4/24 (2013.01);
Abstract

Provided are an apparatus failure influence range recognition apparatus, an apparatus failure influence range recognition method, and a program capable of billing for a proper call charge for a call suspected of non-provision of a service. An apparatus failure influence range recognition apparatus includes a reception unit configured to receive apparatus failure information which is failure information of an element constituting a network, user information which is information regarding a user of a service, and call details information of an IP telephone, and a calculation unit configured to calculate, by linking the apparatus failure information, the user information, and the call details information with each other, a subtracted call charge with respect to a call charge for a suspected call influenced by an apparatus failure.


Find Patent Forward Citations

Hirabayashi, Atsushi. (2022). Device failure influence range grasping apparatus, device failure influence range grasping method, and program (U.S. Patent No. 11489968). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11489968

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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