The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Jul. 01, 2021
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Luke Cirillo, Poing, DE;
Alexander Breitenfeld, Markt Schwaben, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
The present disclosure relates to a method () for characterizing a wideband RF device-under-test (DUT) by means of a narrowband RF source or a narrowband RF receiver, the method () comprising: selecting () a bandwidth of the wideband RF DUT to be analyzed; dividing () the selected bandwidth into at least two overlapping sub-bands, the respective sub-bands having a frequency range that corresponds to a bandwidth of the narrowband RF source or the narrowband RF receiver; acquiring () a response of the wideband RF DUT for each of the at least two overlapping sub-bands by means of at least two narrowband measurements using the narrowband RF source or the narrowband RF receiver; and calculating () a continuous amplitude response and a continuous phase response of the wideband RF DUT in a frequency range that corresponds to the combined bandwidth of the at least two overlapping sub-bands, said calculation making use of the overlap of the sub-bands.