The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Sep. 11, 2020
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Bharat Balar, Bengaluru, IN;

Parthasarthy V. Sampath, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); G01S 13/04 (2006.01); G01S 7/40 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); G01S 7/40 (2013.01); G01S 7/4021 (2013.01); G01S 13/04 (2013.01); H03M 1/109 (2013.01);
Abstract

A system may include ADC circuitry. To test the performance of the ADC circuitry, the system may include ADC testing circuitry coupled to the ADC circuitry. In particular, the ADC testing circuitry may include reference voltage generation circuitry configured to generate reference voltages serving as test voltages for the ADC circuitry. The ADC circuitry may be coupled to a test input for receiving the test voltages via switching circuitry and may be coupled to a main data input for receiving system data via the switching circuitry. Testing may occur during an idling time period of the system and when the switching circuitry couples the test input to the ADC circuitry. Test input voltages corresponding to one or more stages in the ADC circuitry may be provided to the ADC circuitry, and corresponding output values from the ADC circuitry may be compared to an expected value and/or expected threshold values.


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