The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Oct. 06, 2021
Applicant:

Asti Global Inc., Taiwan, Taichung, TW;

Inventor:

Ying-Chieh Chen, Taichung, TW;

Assignee:

ASTI GLOBAL INC., TAIWAN, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 33/00 (2010.01);
U.S. Cl.
CPC ...
H01L 22/14 (2013.01); H01L 22/12 (2013.01); H01L 22/32 (2013.01); H01L 33/005 (2013.01);
Abstract

An electronic component measuring equipment includes a first mounting platform, a second mounting platform, an actuating device, a current output module, a switching device and an optical measuring component. Multiple probe pairs are disposed on a probe substrate mounted on the first mounting platform. Multiple under-test electronic components are disposed on a testing substrate mounted on the second mounting platform. The actuating device is configured to make at least partial of the probe pairs on the probe substrate in contact with at least partial of under-test electronic components. The current output module provides a constant current to the probe substrate, and conducting loops are formed between the probe pairs and the under-test electronic components in contact therewith. The switching device switches the constant current to each probe pairs. The optical measuring component measures light signals generated by the under-test electronic components.


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