The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Feb. 17, 2021
Applicant:

Micromass Uk Limited, Wilmslow, GB;

Inventors:

Martin Raymond Green, Bowdon, GB;

Jason Lee Wildgoose, Stockport, GB;

Steven Derek Pringle, Darwen, GB;

Kevin R. Howes, Altrincham, GB;

Assignee:

Micromass UK Limited, Wilmslow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/025 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/4265 (2013.01);
Abstract

A method of mass and/or ion mobility spectrometry is disclosed that comprises accumulating ions for a first period of time (T) one or more times so as to form one or more first groups of ions, accumulating ions for a second period of time (T) one or more times so as to form one or more second groups of ions, wherein the second period of time (T) is less that the first period of time (T), analysing the one or more first groups of ions to generate one or more first data sets, analysing the one or more second groups of ions to generate one or more second data sets, and determining whether the one or more first data sets comprise saturated and/or distorted data. If it is determined that the one or more first data sets comprise saturated and/or distorted data, then the method further comprises replacing the saturated and/or distorted data from the one or more first data sets with corresponding data from the one or more second data sets.


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