The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jul. 06, 2021
Applicant:

Realtek Semiconductor Corporation, Hsinchu, TW;

Inventors:

Chun-Yi Kuo, Hsinchu, TW;

Ying-Yen Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); H03K 5/01 (2006.01); G11C 11/418 (2006.01); G01R 31/317 (2006.01); H03K 5/13 (2014.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50012 (2013.01); G01R 31/31712 (2013.01); G01R 31/31727 (2013.01); G11C 11/418 (2013.01); H03K 5/01 (2013.01); H03K 5/13 (2013.01); H03K 2005/00019 (2013.01);
Abstract

Disclosed is a device for detecting the margin of a circuit operating at an operating speed. The device includes: a signal generating circuit generating an input signal including predetermined data; a first adjustable delay circuit delaying the input signal by a first delay amount and thereby generating a delayed input signal; a circuit under test performing a predetermined operation based on a predetermined operation timing and thereby generating a to-be-tested signal according to the delayed input signal; a second adjustable delay circuit delaying the to-be-tested signal by a second delay amount and thereby generating a delayed to-be-tested signal; a comparison circuit comparing the data included in the delayed to-be-tested signal with the predetermined data based on the predetermined operation timing and thereby generating a comparison result; and a calibration circuit determining whether the circuit under test passes a speed test according to the comparison result.


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