The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jun. 02, 2020
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Michael Louis Wick, Lexington, MA (US);

Jean-Baptiste Frederic George Tristan, Lexington, MA (US);

Jason Peck, Andover, MA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/01 (2013.01); G10L 15/06 (2013.01); G10L 15/197 (2013.01);
U.S. Cl.
CPC ...
G10L 15/01 (2013.01); G10L 15/063 (2013.01); G10L 15/197 (2013.01);
Abstract

A method of evaluating a language model using negative data may include accessing a first language model that is trained using a first training corpus, and accessing a second language model. The second language model may be configured to generate outputs that are less grammatical than outputs generated by the first language model. The method may also include training the second language model using a second training corpus, and generating output text from the second language model. The method may further include testing the first language model using the output text from the second language model.


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