The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Oct. 30, 2020
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Petr Shepelev, Campbell, CA (US);

Takayuki Noto, Tokyo, JP;

Takashi Nose, Kanagawa, JP;

Assignee:

SYNAPTICS INCORPORATED, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09F 9/30 (2006.01); G01B 7/30 (2006.01); H01L 41/113 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
G09F 9/301 (2013.01); G01B 7/30 (2013.01); H01L 41/1132 (2013.01); H01L 51/0097 (2013.01);
Abstract

A method and apparatus for sensing strain in a flexible electronic display. In some implementations, a display controller may be coupled to an electronic display panel. The display controller is configured to receive sensor signals from one or more piezoresistive sensors disposed in the electronic display panel, determine an amount of strain in the electronic display panel based on the received sensor signals, determine a bend angle of the electronic display panel based on the determined amount of strain, and update a configuration of the electronic display panel based at least in part on the determined bend angle. In some implementations, the electronic display panel may be an organic light-emitting diode (OLED) display panel. In some implementations, the electronic display panel may include a polycrystalline silicon (poly-Si) backplane disposed on a flexible substrate, where each of the piezoresistive sensors includes one or more strain gauges formed on the poly-Si backplane.


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