The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Sep. 30, 2019
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventors:
Aravind Nagarajan, Cupertino, CA (US);
Jason Lenox Copeland, Mountain View, CA (US);
Vinayak Ashutosh Agarwal, Newark, CA (US);
Alexei Shlychkov, Castro Valley, CA (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06N 20/00 (2019.01); G06K 9/00 (2022.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06N 20/00 (2019.01); G06V 20/10 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/20132 (2013.01);
Abstract
Techniques for applying one or more machine learning models to a sub-region less than all of an image scene are described. An example is receiving first sub-region from an image; analyzing the received first sub-region of the image using the indicated least one machine learning model to perform the analyzing of the first sub-region of the scene; and outputting a result of the analyzing.