The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Dec. 30, 2019
Perimetrics, Llc;
James C. Earthman, Irvine, CA (US);
Aboozar Mapar, Foothill Ranch, CA (US);
Michael David Swinson, Santa Monica, CA (US);
Dennis A. Quan, Jr., Cary, NC (US);
Perimetrics, Inc., Redmond, WA (US);
Abstract
The present invention relates generally to a system and method for measuring the structural characteristics of an object. The object is subjected to an energy application processes and provides an objective, quantitative measurement of structural characteristics of an object. The system may include a device, for example, a percussion instrument, capable of being reproducibly placed against the object undergoing such measurement for reproducible positioning. The invention provides for a system and methods for analyzing measured characteristics utilizing machine learning to create a system for predicting pathologies from measurements.