The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Apr. 13, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Tiago Salviano Calmon, Rio de Janeiro, BR;

Eduardo Vera Sousa, Niterói, BR;

Hugo de Oliveira Barbalho, Rio de Janiero, BR;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06F 21/62 (2013.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06F 21/6218 (2013.01); G06N 20/00 (2019.01);
Abstract

Techniques are provided for predicting a time to complete a data protection operation. One method comprises obtaining metadata for (i) a given data protection appliance, and/or (ii) a cluster of similar data protection appliances comprising the given data protection appliance; evaluating first level features using the obtained metadata; evaluating a second level feature using some of the evaluated first level features; and processing one or more of the first level features, and the second level feature, using a model that provides a predicted time to complete a data protection operation with respect to data of a protected device associated with the given data protection appliance. The predicted time may comprise a tolerance based on a robustness factor. The predicted time may be based on a number of protected devices that are concurrently undergoing a data protection operation with the protected device for one or more time intervals.


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