The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jun. 03, 2019
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Arnab Chowdhury, Bangalore, IN;

Ramakanth Kanagovi, Bangalore, IN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06F 11/00 (2006.01); G06N 3/08 (2006.01); G06N 5/00 (2006.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06N 3/0454 (2013.01); G06F 11/008 (2013.01); G06N 3/04 (2013.01); G06N 3/0445 (2013.01); G06N 3/08 (2013.01);
Abstract

A system, method, and computer-readable medium are provided for a hardware component failure prediction system that can incorporate a time-series dimension as an input while also addressing issues related to a class imbalance problem associated with failure data. Embodiments utilize a double-stacked long short-term memory (DS-LSTM) deep neural network with a first layer of the DS-LSTM passing hidden cell states learned from a sequence of multi-dimensional parameter time steps to a second layer of the DS-LSTM that is configured to capture a next sequential prediction output. Output from the second layer is combined with a set of categorical variables to an input layer of a fully-connected dense neural network layer. Information generated by the dense neural network provides prediction of whether a hardware component will fail in a given future time interval.


Find Patent Forward Citations

Loading…