The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Dec. 20, 2019
Mitsubishi Electric Corporation, Tokyo, JP;
Kenta Fukami, Tokyo, JP;
Mitsunobu Yoshinaga, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
The vulnerability influence evaluation system includes: a vulnerability information storage unit which stores vulnerability information; a vulnerability information collecting unit which collects the latest vulnerability information from the vulnerability information storage unit; a system relevance determination unit which compares system definition information about an evaluation target system with the vulnerability information, and determines whether or not there is relevance between the evaluation target system and vulnerability; a vulnerability influence degree calculation unit which calculates the vulnerability influence degree of vulnerability relevant to the evaluation target system on the basis of vulnerability influence degree calculation information; a vulnerability influence degree determination unit which performs determination as to the vulnerability level of the evaluation target system on the basis of the vulnerability influence degree; and an evaluation result output unit which outputs a result of determination by the vulnerability influence degree determination unit.